Medidor de rugosidad

Rugosímetro de palpador separado SD-SRT311

Modelo: SD-SRT311

Ra 0.005–32 μm · 23 parameters · 3.5″ TFT · Bluetooth

  • Recorrido eje Z 320 μm
  • Recorrido eje X 17.5 mm
  • Resolución 0.001 μm
  • Pantalla 3.5″ TFT 480×320
  • Almacenamiento 100 measurements
  • Peso 380 g
Hable con nosotros

Pedido mínimo 1 unidad · Plazo 5 días hábiles · Respuesta en 8 horas · OEM / ODM disponible · Garantía 2 años

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Las especificaciones técnicas se facilitan en inglés para garantizar la exactitud de los valores numéricos. Para un presupuesto o una confirmación técnica en español, contáctenos directamente.

Overview

The SD-SRT311 is a split-type surface roughness tester: the drive unit separates from the main unit for measuring positions the instrument body cannot reach, and stores inside the main unit when not in use. It measures flat, inclined, cylindrical and curved surfaces, small holes and grooves on both metal and non-metal parts, without damaging the workpiece.

A 3.5-inch 480 × 320 TFT display shows the parameter values together with a live roughness curve while measuring. Data can be sent over Bluetooth to a printer or an Android phone, or to a PC through the supplied cable. The DSP processor keeps power consumption low while maintaining a 0.001 µm display resolution.

Features

  • Split design — the drive unit can be stored inside the main unit and separated for remote measurement
  • Wide measuring range: 320 µm on the Z axis, 17.5 mm on the X axis
  • 3.5-inch (480 × 320) TFT display with backlight and wide viewing angles
  • Real-time waveform with synchronous display of the curve during measurement
  • DSP chip processor — high speed, low power consumption
  • Bluetooth connection to printer and Android phone; PC software via supplied cable
  • KS160 axe-type standard sensor, suitable for about 90% of samples
  • On-screen practical information: battery indicator, stylus position, device states, parameter settings
  • On-board storage for 100 measurements

Measuring Range

Ra, Rq 0.005–32 µm
Rz, R3z, Ry, Rt, Rp, Rv 0.02–320 µm
Rsk 0–100%
Rs, Rsm 0.02–1000 µm

Technical Data

Measuring range — Z axis (vertical) 320 µm (−160 µm ~ +160 µm) / 12 600 µin (−6300 ~ +6300 µin)
Measuring range — X axis (transverse) 17.5 mm (0.69″)
Resolution 0.002 µm/±20 µm  ·  0.004 µm/±40 µm  ·  0.008 µm/±80 µm  ·  0.02 µm/±160 µm
Parameters Ra, Rz, Rq, Rt, Rc, Rp, Rv, R3z, R3y, Rz(JIS), Ry, Rs, Rsk, Rku, Rmax, Rsm, Rmr, Rpc, Rk, Rpk, Rvk, Mr1, Mr2
Standards ISO 4287, ANSI B46.1, DIN 4768, JIS B601
Assessed graphics Rmr curve, roughness curve, primary profile
Filter RC, PC-RC, Gauss, D-P
Sampling length (lr) 0.25 / 0.8 / 2.5 mm
Assessment length (ln) Ln = lr × n, n = 1–5
Sensor principle Differential inductance
Stylus tip Diamond, 90° cone angle, 5 µmR
Force Measuring force < 4 mN, skid force < 400 mN
Skid Hard alloy, radius of curvature 40 mm
Measuring speed lr 0.25 → 0.135 mm/s  ·  lr 0.8 → 0.5 mm/s  ·  lr 2.5 → 1 mm/s  ·  return 1 mm/s
Accurate to 0.001 µm
Tolerance ≤ ±(5 nm + 0.1A)  (A: Ra standard value of precise specimen)
Residual profile ≤ 0.010 µm
Repeatability ≤ 3%
Dimension Main unit 64 × 53 × 160 mm; drive unit 23 × 27 × 115 mm
Weight 380 g
Working environment −20 °C ~ 40 °C, < 90% RH
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